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[sdpd] RIET: Registration deadline 13th April - Seventh Canadian Powder Diffraction Workshop - 16th to 18th May 2007, Trois-Rivières , Québec , Canada
Registration deadline 13th April
http://www.cins.ca/cpdw/registration.html
Seventh Canadian Powder Diffraction Workshop
Pavillon Ringuet, Université du Québec à Trois-Rivières, Québec, Canada
Wednesday 16th to Friday 18th of May, 2007
http://www.cins.ca/cpdw/
The third day of workshop is PDF (Pair Distribution Function) and
Total Scattering Analysis presented by Dr Thomas Proffen of Los
Alamos National Laboratory, USA
The main theme of the workshop is in the fundamentals of using powder
diffraction, and assisting participants in using the Rietveld method.
Lectures on a variety of topics are planned for the morning, with the
afternoon practical sessions concentrating on using GSAS for performing
Rietveld analysis for structure refinement and quantitative phase
analysis.
The first two days of this workshop concentrates on powder diffractoin
and Rietveld Analysis. The third day focusses on PDF (Pair Distribution
Function)/Total Scattering analysis of amorphous, disordered, poorly
crystalline or nano-crystalline materials.
Trois-Rivières is located roughly mid way between Montréal and Québec
City. The most convenient airport is Dorval International Airport (now
called Montréal-Trudeau Airport) in Montréal; and is a 75 minute drive
from Montréal and from Québec City.
------------------
Directions and travel hints are given at:
http://www.cins.ca/cpdw/travel.html
Venue information and accommodation options (which includes option of 2
nights on campus package at Cdn $90) at:
http://www.cins.ca/cpdw/venue.html
and
http://www.cins.ca/cpdw/accomm.html
------------------
Registration Costs (includes lunches, two dinners and taxes):
University based (Student/Staff/Postdoc/Academic): Cdn $250
Regular : 450 $ CAN
Registration form is downloadable from the following webpage. Payment
options include bill, credit card and cheque.
http://www.cins.ca/cpdw/registration.html
Registration deadline of 13th April, 2007.
------------------
Chair: Professor Jacques Huot (Université du Québec à Trois-Rivières)
Speakers:
Dr Robert Von Dreele (Argonne National Laboratory, USA)
Dr Angus Wilkinson (Georgia Institute of Technology, USA)
Dr Thomas Proffen (Los Alamos National Laboratory, USA)
Dr Ian Swainson (National Research Council of Canada)
Lachlan Cranswick (National Research Council of Canada)
Talks include:
http://www.cins.ca/cpdw/program.html
Introduction to Powder Diffraction and Powder Diffraction Hardware
Introduction to the basics of crystallography
Sample preparation, data collection considerations and phase
identification using powder X-ray diffraction
Introduction to Powder Profile Refinement
Profile Refinement with GSAS
Synchrotron and Neutron Experiments
Freely available powder diffraction Software
Beyond the Bragg peaks or why do we care about total scattering?
Measuring total scattering X-ray and neutron data: where and how?
What to do with your PDF: Modeling of disordered structures
----------
Brief Pictorial History of the Rietveld Method
On the logo webpage, a brief pictorial history of the Rietveld method is
included:
http://www.cins.ca/cpdw/logo.html
----------
A poster for the workshop is downloadable at:
http://www.cins.ca/cpdw/images/cpdw_poster_2007.pdf
If there are students and/or XRD users in your institute who might
benefit from attending such a workshop, we would be appreciate it if
this were brought to their attention. Please download the poster and
post on departmental notice boards if appropriate.
====================================================================
-----------------------
Lachlan M. D. Cranswick
Contact outside working hours /
Coordonnees en dehors des heures de travail:
NEW E-mail / courriel: lc *at* bluehaze.com.au
Home Tel: (613) 584-4226 ; Mobile/Cell: 613 401 3433
WWW: http://lachlan.bluehaze.com.au/
P.O. Box 2057, Deep River, Ontario, Canada, K0J 1P0
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