Re: [sdpd] overlapping reflections / preferred orientation

[Jon Wright <wright...@esrf.fr>]

 > On another note a "theoretical question": in the same way one can 
derive the zero shift on a diffraction pattern by harmonic analysis 
without an internal standard, is there a way to derive a possible 
preferred orientation vector without a structural model? and where can I 
learn more about that?

If you can measure several diffraction patterns for samples prepared 
differently (eg mounted in a capillary versus spread on a flat plate) 
then you can see if you have a texture problem. Best is if you can get 
access to an instrument with an area detector. Some notes at:

http://zeolites.ethz.ch/research/zeolite_group/Texture/Texture.html

Where the group have been using the prefered orientation to improve the 
estimation of overlapped peaks - without a structural model. Several 
references can be found within that website.

Good luck,

Jon



 
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