I'm still trying to figure out all my problems, my diffraction problems anyway.
In the documentation for FullProf, section 3.8c: Systematic line shifts for
curved PSD, there is mention that the sample displacement correction takes
the form SYSIN*sin(TwoTheta), SYSIN=refined parameter.
Can anyone tell me where I can find a derivation of this? And perhaps a
reference on the geometry of asymmetric diffractometers in general?
Thanks,
chuck
Charles Witham
Graduate Research Assistant, Materials Science
California Institute of Technology
Mail Stop 138-78 ckw@hyperfine.caltech.edu
Pasadena, CA 91125 (626) 395-3627
fax -2940
JPL lab (818) 393-4209