It sounds like a hot and interesting topic in the following weeks (ECM-18
and EPDIC-6) and is likely to continue in years to come. Just as an
information to those interested, I'll be comparing the
"fundamental-parameter" with "standard" approach in my talk at the EPDIC-6
(morning of Aug 25). Of course, it won't be as detailed as we expect from
the workshop, but maybe from a little different perspective. This comparison
is likely to complement (and contradict ?) Armel Le Bail's remarks at the
last week's Denver X-Ray Conference (for those not able to attend, I suppose
that Armel made his position on this question known to this mailing list's
audience last month).
I look forward to an excellent EPDIC and exciting discussions on this issue
(Lachlan, admit it, it makes you happy to hear this -- we still remember the
recent more-than-fruitful discussion on structure-solving techniques that
you precipitated).
Best regards to all,
Davor Balzar
balzar@nist.gov`