[sdpd] Residual stress measurement by X-ray diffraction

[박현민 <hmpark...@kriss.re.kr>]

Dear Colleagues, 
 
I am going to get the depth profile of residual stress in ceramic material by nondestructive method such as X-ray diffraction. 
However I have no idea how to solve the problem. If let me inform an idea, I would be grateful for them. 
 
Thak you very much in advance 
 
========================================================= 
Hyun Min PARK 
Korea Research Institute of Standards and Science(KRISS) 
Materials Evaluation Center, P.O.Box 102, Yusong, 305-600, Korea 
TEL)82-42-868-5277 
FAX)82-42-868-5032 
E-mail)hmpark...@kriss.re.kr 
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