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Re: [sdpd] error measurements
I think one point re background subtraction in Rwp is being missed. Background
count can be subtracted before the refinement process (as in the original
Rietveld) or after using the refinable background function, i.e. the calculated
background is subtracted. Both can easily be done. Also, in the summation
process, profile point should not be included where there is no diffraction
information.
Jeremy Karl Cockcroft.