[sdpd] simple questions

["Guilhem Dezanneau" <gdezano...@inpg.fr>]

two questions :

for acquisitions of diffraction digrams for Rietveld refinements, is it better

to use step scan or continuous scan acquisitions ?

Where to find standards for instrumental resolution calibration ?

Si from classical providers seems to give poor results (FWHM

equal in the case of 0.018 or 0.05 resolution slits) while ZrO2

synthesised in our laboratory gave better results.