Some chapters consist of several sections contributed different authors, e.g. authorship (A; B; C) indicates that the first, second and third sections are written author(s) A, B and C, respectively.

• PART 1: CRYSTAL GEOMETRY AND SYMMETRY
• 1.1. Summary of General Formulae (E. Koch)
• 1.2. Application to the Crystal Systems (E. Koch)
• 1.3. Twinning (E. Koch)
• 1.4. Arithmetic Crystal Classes and Symmorphic Space Groups (A. J. C. Wilson)
• PART 2: DIFFRACTION GEOMETRY AND ITS PRACTICAL REALIZATION
• 2.1. Classification of Experimental Techniques (J. R. Helliwell)
• 2.2. Single-Crystal X-ray Techniques (J. R. Helliwell)
• 2.3. Powder and Related Techniques: X-ray Techniques (W. Parrish and J. I. Langford)
• 2.4. Powder and Related Techniques: Electron and Neutron Techniques (J. M. Cowley; A. W. Hewat)
• 2.5. Energy-Dispersive Techniques (B. Buras and L. Gerward; J. D. Jorgensen, W. I. F. David, and B. T. M. Willis)
• 2.6. Small-Angle Techniques (O. Glatter; R. May)
• 2.7. Topography (A. R. Lang)
• 2.8. Neutron Diffraction Topography (M. Schlenker and J. Baruchel)
• 2.9. Neutron Reflectometry (G. S. Smith and C. F. Majkrzak)
• PART 3: PREPARATION AND EXAMINATION OF SPECIMENS
• 3.1. Preparation, Selection, and Investigation of Specimens (P. F. Lindley)
• 3.2. Determination of the Density of Solids (P. F. Lindley; F. M. Richards; P. F. Lindley)
• 3.3. Measurement of Refractive Index (E. S. Larsen Jr, R. Meyrowitz, and A. J. C. Wilson)
• 3.4. Mounting and Setting of Specimens for X-ray Crystallographic Studies (P. F. Lindley)
• 3.5. Preparation of Specimens for Electron Diffraction and Electron Microscopy (N. J. Tighe, J. R. Fryer, and H. M. Flower)
• 3.6. Specimens for Neutron Diffraction (B. T. M. Willis)
• PART 4: PRODUCTION AND PROPERTIES OF RADIATIONS
• 4.1. Radiations used in Crystallography (V. Valvoda)
• 4.2. X-rays (U. W. Arndt; R. D. Deslattes, E. G. Kessler Jr, P. Indelicato, and E. Lindroth; D. C. Creagh; D. C. Creagh and J. H. Hubbell; D. C. Creagh; D. C. Creagh)
• 4.3. Electron Diffraction (J. M. Cowley; J. M. Cowley, L. M. Peng, G. Ren, S. L. Dudarev, and M. J. Whelan; A. W. Ross, M. Fink, R. Hilderbrandt, J. Wang, and V. H. Smith Jr; C. Colliex; B. B. Zvyagin; D. F. Lynch; A. Howie; J. Gjønnes, and J. W. Steeds; J. C. H. Spence and J. M. Cowley)
• 4.4. Neutron Techniques (J. M. Carpenter and G. Lander; I. S. Anderson and O. Schärpf; R. Pynn and J. M. Rowe; V. F. Sears; P. J. Brown; B. T. M. Willis)
• PART 5: DETERMINATION OF LATTICE PARAMETERS
• 5.1. Introduction (A. J. C. Wilson)
• 5.2. X-ray Diffraction Methods: Polycrystalline (W. Parrish, A. J. C. Wilson, and J. I. Langford)
• 5.3. X-ray Diffraction Methods: Single Crystal (E. Galdecka)
• 5.4. Electron Diffraction Methods (A. W. S. Johnson; A. Olsen)
• 5.5. Neutron Methods (B. T. M. Willis)
• PART 6: INTERPRETATION OF DIFFRACTED INTENSITIES
• 6.1. Intensity of Diffracted Intensities (E. N. Maslen, A. G. Fox, and M. A. O'Keefe; P. J. Brown; B. T. M. Willis)
• 6.2. Trigonometric Intensity Factors (H. Lipson, J. I. Langford, and H.-C. Hu)
• 6.3. X-ray Absorption (E. N. Maslen)
• 6.4. The Flow of Radiation in a Real Crystal (T. M. Sabine)
• PART 7: MEASUREMENT OF INTENSITIES
• 7.1. Detectors for X-rays (P. M. de Wolff; W. Parrish and J. I. Langford; W. Parrish; B. Buras and L. Gerward; U. W. Arndt; J. Chikawa; Y. Amemiya and J. Chikawa)
• 7.2. Detectors for Electrons (J. N. Chapman)
• 7.3. Thermal Neutron Detection (P. Convert and P. Chieux)
• 7.4. Correction of Systematic Errors (B. T. M. Willis; N. G. Alexandropoulos and M. J. Cooper; P. Suortti)
• 7.5. Statistical Fluctuations (A. J. C. Wilson)
• PART 8: REFINEMENT OF STRUCTURAL PARAMETERS
• 8.1. Least Squares (E. Prince and P. T. Boggs)
• 8.2. Other Refinement Methods (E. Prince and D. M. Collins)
• 8.3. Constraints and Restraints in Refinement (E. Prince, L. W. Finger, and J. H. Konnert)
• 8.4. Statistical Significance Tests (E. Prince and C. H. Spiegelman)
• 8.5. Detection and Treatment of Systematic Error (E. Prince and C. H. Spiegelman)
• 8.6. The Rietveld Method (A. Albinati and B. T. M. Willis)
• 8.7. Analysis of Charge and Spin Densities (P. Coppens, Z. Su, and P. J. Becker)
• 8.8. Accurate Structure Factor Determination with Electron Diffraction (J. Gjønnes)
• PART 9: BASIC STRUCTURAL FEATURES
• 9.1. Sphere Packings and Packings of Ellipsoids (E. Koch and W. Fischer)
• 9.2. Layer Stacking (D. Pandey and P. Krishna; S. Durovic)
• 9.3. Typical Interatomic Distances: Metals and Alloys (J. L. C. Daams, J. R. Rodgers, and P. Villars)
• 9.4. Typical Interatomic Distances: Inorganic Compounds (G. Bergerhoff and K. Brandenburg)
• 9.5. Typical Interatomic Distances: Organic Compounds (F. H. Allen, D. G. Watson, L. Brammer, A. G. Orpen, and R. Taylor)
• 9.6. Typical Interatomic Distances: Organometallic Compounds and Coordination Complexes of the d- and f-Block Metals (A. G. Orpen, L. Brammer, F. H. Allen, D. G. Watson, and R. Taylor)
• 9.7. The Space-Group Distribution of Molecular Organic Structures (A. J. C. Wilson, V. L. Karen, and A. Mighell)
• 9.8. Incommensurate and Commensurate Modulated Structures (T. Janssen, A. Janner, A. Looijenga-Vos, and P. M. de Wolff)
• PART 10: PRECAUTIONS AGAINST RADIATION INJURY (D. C. Creagh and S. Martinez-Carrera)
• Author Index
• Subject Index

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